Yongin-si, South Korea

Eun Jung Lee

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eun Jung Lee. Retrieved from https://idiyas.com/inventor/eun-jung-lee-yy1atcn8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eun Jung Lee - Innovator in Light Measurement Technology

Introduction

Eun Jung Lee is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of light measurement technology. His innovative approach has led to the development of a unique light measuring device that enhances the accuracy and efficiency of light measurement.

Latest Patents

Eun Jung Lee holds a patent for a light measuring device. This device includes a first lens, a first variable opening, a second lens, a second variable opening, a third lens, and a light receiving unit. The design allows for independent adjustment of the diameters of the first and second variable openings, which improves the device's functionality and precision.

Career Highlights

Eun Jung Lee is currently employed at Samsung Display Co., Ltd. His work at this leading technology company has allowed him to focus on advancing light measurement technologies. His patent reflects his commitment to innovation and excellence in his field.

Collaborations

Eun Jung Lee collaborates with talented colleagues, including A Ree Song and Ha Young Lee. Their teamwork fosters a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Eun Jung Lee's contributions to light measurement technology exemplify his innovative spirit and dedication to advancing the field. His patent for a light measuring device showcases his ability to create practical solutions that meet industry needs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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