Braunschweig, Germany

Eugen Trapet

This inventor holds 1 USPTO granted patent. Top assignee: Leitz Messtechnik Gmbh. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eugen Trapet. Retrieved from https://idiyas.com/inventor/eugen-trapet-unj526mz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Eugen Trapet: Innovator in Coordinate Measuring Technology

Introduction

Eugen Trapet is a notable inventor based in Braunschweig, Germany. He has made significant contributions to the field of coordinate measuring technology. His innovative approach has led to the development of a unique patent that enhances measurement accuracy.

Latest Patents

Eugen Trapet holds a patent for "Test specimens composed of rod segments for coordinate measuring." This invention is designed to improve the precision and reliability of measurements in various applications. The patent showcases his commitment to advancing technology in the measurement sector.

Career Highlights

Eugen Trapet is currently employed at Leitz Messtechnik GmbH, a company renowned for its expertise in measurement technology. His role at the company allows him to apply his innovative ideas and contribute to the development of cutting-edge measurement solutions. His work has been instrumental in enhancing the company's product offerings.

Collaborations

Eugen collaborates with his coworker, Franz Waeldele, to further advance their projects and innovations. Their teamwork exemplifies the importance of collaboration in driving technological advancements.

Conclusion

Eugen Trapet is a distinguished inventor whose work in coordinate measuring technology has made a lasting impact. His patent and contributions to Leitz Messtechnik GmbH highlight his dedication to innovation and excellence in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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