Meilen, Switzerland

Eugen Meier

This inventor holds 6 USPTO granted patents. Top assignees: Mettler Instrumente Ag, Mettler-Toledo Ag. Active years: 1976-1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eugen Meier. Retrieved from https://idiyas.com/inventor/eugen-meier-9xqt8j7w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.1

ph-index = 5

Forward Citations = 50(Granted Patents)


Company Filing History:


Years Active: 1976-1995

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6 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Eugen Meier

Introduction

Eugen Meier is a notable inventor based in Meilen, Switzerland. He has made significant contributions to the field of measurement and weighing technology, holding a total of six patents. His work reflects a commitment to enhancing precision and efficiency in various applications.

Latest Patents

One of his latest patents is a planar single-piece measuring string with two nodes for measurement. This innovative design features a resonating string section and elastic flaps that enhance its oscillation capabilities. Another notable patent is a weighing apparatus that includes improved force-transmitting lever means. This apparatus utilizes a resilient parallel guidance arrangement to ensure accurate measurements while minimizing disturbances.

Career Highlights

Eugen Meier has worked with prominent companies such as Mettler Instrumente AG and Mettler-Toledo AG. His experience in these organizations has allowed him to develop and refine his inventions, contributing to advancements in measurement technology.

Collaborations

Throughout his career, Eugen has collaborated with various professionals, including Milan Ellner. These partnerships have fostered innovation and the exchange of ideas in the field.

Conclusion

Eugen Meier's contributions to measurement and weighing technology are noteworthy. His patents demonstrate a blend of creativity and practicality, making a lasting impact in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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