Toulouse, France

Etienne Snoeck

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Centre National De La Recherche Scientifique. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Etienne Snoeck. Retrieved from https://idiyas.com/inventor/etienne-snoeck

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Etienne Snoeck in Nanoscale Deformation Measurement

Introduction

Etienne Snoeck, a prominent inventor based in Toulouse, France, has made a significant contribution to the field of nanoscale deformation measurement. With an innovative approach, his work has streamlined the capabilities of measuring minute deformations in materials, which is critical for advancements in various technological domains.

Latest Patents

Etienne Snoeck holds a patent for a groundbreaking method, device, and system for measuring nanoscale deformations. This patent describes a detailed methodology that includes providing a specimen, illuminating it with an electron beam, and employing interference patterns to deduce changes in lattice parameters between measurement and reference areas. The patent emphasizes the precision achievable in detecting deformations at the nanoscale level, an essential capability for material science research and applications.

Career Highlights

Snoeck's career is marked by his association with the Centre National de la Recherche Scientifique (CNRS), where he has conducted extensive research. His patent reflects his commitment to advancing scientific understanding and practical applications in material sciences. His innovative spirit and technical prowess have positioned him as a key figure in his field.

Collaborations

While working at CNRS, Etienne Snoeck has collaborated with esteemed colleagues, including Martin Hytch and Florent Houdellier. These partnerships have fostered an environment of collective innovation and have been instrumental in pushing the boundaries of research in nanoscale measurement techniques.

Conclusion

Etienne Snoeck's contributions to the measurement of nanoscale deformations exemplify the profound impact of innovation in scientific research. His solitary patent not only marks a personal achievement but also serves as a crucial tool for the advancement of material sciences. Through his collaboration and work at CNRS, Snoeck continues to inspire current and future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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