Saint Paul, MN, United States of America

Esther S Jeong

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: 3M Innovative Properties Company. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Esther S Jeong. Retrieved from https://idiyas.com/inventor/esther-s-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Esther S. Jeong: Inventor of a Replacement-Part Validation System.

Introduction

Esther S. Jeong is an inventor associated with Saint Paul, Minnesota, and 3M Innovative Properties Company. Her patent work addresses how replacement parts can be identified, assessed, and matched to repair jobs.

Latest Patents

Jeong is named on one patent, “Replacement Part Validation Systems and Methods.” The invention describes a system that scans a received part and uses the scan results to identify it and assess its quality. A recognition module consults a parts database to find the most likely match, while the system compares the received part with that match to determine a quality metric. A job assignment module can associate the part with an outstanding repair job, and an output generator presents the job and quality information to a source.

Career Highlights

Jeong’s listed patent reflects an application of scanning, database matching, and automated job assignment to replacement-part validation. The system is designed to help connect a part’s identification and assessed quality with an appropriate repair job.

Collaborations

Jeong’s listed coworkers include John W. Henderson and Andrew W. Long. The patent is associated with 3M Innovative Properties Company.

Conclusion

Esther S. Jeong’s patent describes a practical approach to validating replacement parts by combining scanning, database-based identification, quality assessment, and repair-job assignment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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