Erwin Kreuzer

Title: Erwin Kreuzer: Innovator in Film Inspection Technology

Introduction

Erwin Kreuzer is a notable inventor based in Grafing, Germany. He has made significant contributions to the field of film inspection technology, holding 2 patents that showcase his innovative approach to solving industry challenges.

Latest Patents

Kreuzer's latest patents include a "Device for the inspection of coated and uncoated films." This invention allows for the reliable determination and evaluation of variations in thickness and casting errors in films. The device utilizes two light sources that transmit modulated infrared light at different frequencies. One light source transilluminates the film, while the other illuminates the coating carrier obliquely. The resulting light bundles are directed to a photo-receiver, where the current signal is transformed, amplified, and filtered to separate the modulation frequencies. This process enables a detailed evaluation of both coating thickness and surface errors.

Another significant patent is the "Apparatus for determining the thickness of layer supports." This apparatus facilitates on-line measurement of layer thicknesses in moving flexible layer supports using photoelectric means. A UV light source emits a beam through the layer support, and the transmitted light is registered by a photoelectric receiver. The registered signal is then processed by an electronic interpretation mechanism to determine and record the layer thickness in real-time after calibration.

Career Highlights

Throughout his career, Erwin Kreuzer has worked with prominent companies such as Agfa-Gevaert Aktiengesellschaft and Agfa-Gevaert AG. His experience in these organizations has contributed to his expertise in film technology and innovation.

Collaborations

Kreuzer has collaborated with notable individuals in his field, including Richard Zierl and Alfred Zuckermayr. These partnerships have likely enriched his work and led to advancements in film inspection technology.

Conclusion

Erwin Kreuzer is a distinguished inventor whose work in film inspection technology has led to significant advancements in the industry. His innovative patents reflect his commitment to improving the accuracy and reliability of film measurements.