This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1991.
Company Filing History:
Years Active: 1991
Title: Erwin A. Tate: Innovator in Boundary Scan Design
Introduction
Erwin A. Tate is a notable inventor based in Raleigh, NC (US). He has made significant contributions to the field of integrated circuit design, particularly in the area of boundary scan technology. His innovative approach has led to the development of a unique patent that enhances the self-testing capabilities of boundary logic.
Latest Patents
Erwin A. Tate holds a patent for a "By-pass boundary scan design." This invention implements self-testable boundary logic by utilizing a tristate pass gate and a tristate receiver in conjunction with a linear feedback shift register, a storage register, and level sensitive scan design (LSSD) techniques. The linear feedback shift register (LFSR) shifts data into a storage register, which is connected to the data inputs of the boundary logic through the tristate pass gate. The outputs of the tristate input receiver are also connected to the inputs of the boundary logic, allowing it to receive data from either the data input of the integrated circuit or from the storage register connected to the LFSR. This configuration enables efficient self-testing of the boundary logic while minimizing additional silicon area for the self-test structures.
Career Highlights
Erwin A. Tate is associated with the International Business Machines Corporation (IBM), where he has contributed to various projects and innovations in integrated circuit technology. His work has been instrumental in advancing the capabilities of boundary scan designs, making them more efficient and effective.
Collaborations
Throughout his career, Erwin has collaborated with notable colleagues, including Anthony Correale, Jr. and Richard M. Doney. These collaborations have fostered an environment of innovation and have led to significant advancements in their respective fields.
Conclusion
Erwin A. Tate's contributions to boundary scan design exemplify the spirit of innovation in the technology sector. His patent for a by-pass boundary scan design showcases his ability to enhance integrated circuit testing while optimizing resource usage. His work continues to influence the field and inspire future innovations.