Cesiomaggiore, Italy

Eros De Bortoli

This inventor holds 2 USPTO granted patents. Top assignees: Abb Kent-Taylor Limited, Consorzio Abb Per Lo Sviluppo Tecnologico. Active years: 1999-2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eros De Bortoli. Retrieved from https://idiyas.com/inventor/eros-de-bortoli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1999-2001

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2 patents (USPTO):Explore Patents

Title: Eros De Bortoli: Innovator in Pressure Measurement Technology

Introduction

Eros De Bortoli is a notable inventor based in Cesiomaggiore, Italy. He has made significant contributions to the field of pressure measurement technology, holding 2 patents that showcase his innovative approach to engineering.

Latest Patents

His latest patents include a "Method for manufacturing a pressure-measuring device equipped with a resonating element" and a "Pressure measuring membrane with resonant element vibrating orthogonal." These inventions focus on an improved device for measuring pressures, which utilizes a silicon membrane or diaphragm. This diaphragm is exposed to two pressures, and a resonant element is mechanically coupled to it. The resonance frequency of the element varies based on the deformation of the diaphragm, allowing for precise pressure measurements.

Career Highlights

Throughout his career, Eros De Bortoli has worked with prominent companies, including ABB Kent Taylor S.p.A. and Consorzio ABB per lo Sviluppo Tecnologico. His experience in these organizations has contributed to his expertise in developing advanced pressure measurement devices.

Collaborations

Due to space constraints, the details of his collaborations will not be included.

Conclusion

Eros De Bortoli's innovative work in pressure measurement technology highlights his role as a significant contributor to engineering advancements. His patents reflect a commitment to improving measurement accuracy and device functionality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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