St. Gallen, Switzerland

Ernst Lehmann

This inventor holds 2 USPTO granted patents. Top assignee: Gema Ag Apparatebau. Active years: 1982-1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ernst Lehmann. Retrieved from https://idiyas.com/inventor/ernst-lehmann-ssdvzfl5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 1982-1983

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2 patents (USPTO):Explore Patents

Title: Innovations by Ernst Lehmann in Spray-Coating Technology

Introduction

Ernst Lehmann is a notable inventor based in St. Gallen, Switzerland. He has made significant contributions to the field of spray-coating technology, holding 2 patents that showcase his innovative approaches. His work primarily focuses on methods that enhance the efficiency and effectiveness of coating processes.

Latest Patents

Lehmann's latest patents include a method for the spray-coating of the inside of tubular bodies. This method involves a unique approach where a single spray coating operation is performed. A relatively heavy spray jet is concentrated on specific areas, such as seams, while a thinner cloud of coating material is used to cover the entire interior surface. This technique allows for a thinner layer of material to adhere well, even in areas that require a heavier coating.

Career Highlights

Ernst Lehmann is associated with Gema AG Apparatebau, a company known for its advanced coating technologies. His work at Gema has allowed him to develop and refine his innovative spray-coating methods, contributing to the company's reputation in the industry.

Conclusion

Ernst Lehmann's contributions to spray-coating technology reflect his commitment to innovation and efficiency. His patents demonstrate a deep understanding of coating processes, making him a valuable figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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