Vilsbiburg, Germany

Ernst Christi

This inventor holds 1 USPTO granted patent. Top assignee: Epcos Ag. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ernst Christi. Retrieved from https://idiyas.com/inventor/ernst-christi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ernst Christi

Introduction

Ernst Christi is a notable inventor based in Vilsbiburg, Germany. He has made significant contributions to the field of labeling technology. His innovative approach has led to the development of a unique component that enhances the labeling process.

Latest Patents

Ernst Christi holds a patent for a component with a label. This invention proposes that for labeling a component provided with a metallic cover layer, at least one additional contrast layer is arranged over the cover layer. The contrast layer produces an optical contrast with the metallic cover layer and is capable of being eroded by a laser for producing a label. This innovative solution simplifies the labeling process and improves visibility.

Career Highlights

Ernst Christi is associated with Epcos AG, a company known for its advancements in electronic components. His work at Epcos AG has allowed him to focus on developing technologies that enhance product functionality and user experience.

Collaborations

Ernst has collaborated with notable colleagues such as Alois Stelzl and Hans Krüger. Their combined expertise has contributed to the successful development of innovative solutions in their field.

Conclusion

Ernst Christi's contributions to labeling technology exemplify the spirit of innovation. His patent and work at Epcos AG highlight his commitment to advancing technology in practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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