Holland, MI, United States of America

Ernest T Wendt

This inventor holds 1 USPTO granted patent. Top assignee: Access Business Group International LLC. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ernest T Wendt. Retrieved from https://idiyas.com/inventor/ernest-t-wendt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ernest T. Wendt

Introduction

Ernest T. Wendt is a notable inventor based in Holland, MI (US). He has made significant contributions to the field of technology, particularly in the area of gas discharge lamps. His innovative approach has led to the development of a unique system that enhances the testing of lamp filaments.

Latest Patents

Wendt holds a patent for a "System and method for automated filament testing of gas discharge lamps." This system utilizes an ohm meter to determine the resistance of lamp filaments before they are energized. The inclusion of a multiplexer allows for the rapid and accurate testing of multiple lamp filaments, ensuring efficiency in the testing process.

Career Highlights

Wendt is associated with Access Business Group International LLC, where he applies his expertise in developing advanced testing systems. His work has been instrumental in improving the reliability and performance of gas discharge lamps.

Collaborations

Throughout his career, Wendt has collaborated with talented individuals such as Scott A. Mollema and Karlis Vecziedins. These partnerships have fostered innovation and contributed to the success of various projects.

Conclusion

Ernest T. Wendt's contributions to the field of lamp technology exemplify the impact of innovative thinking in engineering. His patent for automated filament testing showcases his commitment to enhancing product reliability and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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