Ooltewah, TN, United States of America

Ernest S Boyd

This inventor holds 1 USPTO granted patent. Top assignee: Tuftco Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ernest S Boyd. Retrieved from https://idiyas.com/inventor/ernest-s-boyd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ernest S. Boyd

Introduction

Ernest S. Boyd is a notable inventor based in Ooltewah, Tennessee. He has made significant contributions to the field of textile engineering, particularly through his innovative patent related to tufted fabrics. His work exemplifies the intersection of creativity and practicality in the world of inventions.

Latest Patents

Ernest S. Boyd holds a patent for a tufted fabric with embedded stitches. This invention provides tufted needlefelts with partially or totally obscured loop bights, which enhance the tuft bind. This innovation is particularly valuable in the textile industry, as it improves the durability and functionality of tufted fabrics.

Career Highlights

Boyd is associated with Tuftco Corporation, a company known for its advancements in tufting technology. His role at Tuftco has allowed him to apply his inventive skills in a practical setting, contributing to the company's reputation for quality and innovation in the textile sector.

Collaborations

Ernest has worked alongside talented colleagues such as Brian K. Lovelady and Steven L. Frost. Their collaborative efforts have fostered an environment of innovation and creativity within Tuftco Corporation.

Conclusion

Ernest S. Boyd's contributions to tufted fabric technology highlight his inventive spirit and dedication to improving textile products. His patent serves as a testament to his innovative capabilities and the impact of his work in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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