Oulu, Finland

Erkki Tiittanen

This inventor holds 1 USPTO granted patent. Top assignee: Nokia Mobile Phones Limited. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erkki Tiittanen. Retrieved from https://idiyas.com/inventor/erkki-tiittanen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Erkki Tiittanen: Microwave Signal Calibration Innovation

Introduction

Erkki Tiittanen is an inventor associated with Oulu, Finland, and Nokia Mobile Phones Limited. His work includes a patent concerning calibration techniques for I/Q channel signals in microwave digital systems.

Latest Patents

Tiittanen is credited with 1 patent, titled “Tuning Techniques for I/Q Channel Signals in Microwave Digital.” The invention describes calibrating a vector modulator without requiring a network analyzer. It measures the power levels of the in-phase (I) and quadrature (Q) signals to identify amplitude imbalance and phase error, then stores corresponding compensation values in read-only memory. These corrections help adjust the relative amplitudes and phases of the modulation signals.

Career Highlights

Tiittanen’s patent addresses a practical calibration challenge in microwave transmitters by using signal power measurements to determine and correct I/Q errors. The disclosed approach integrates amplitude and phase compensation into a vector modulation system.

Collaborations

Tiittanen’s listed coworkers include Kjell I. Ostman and Mikko Veijo Halttunen. His company affiliation is Nokia Mobile Phones Limited.

Conclusion

Erkki Tiittanen’s patent documents a measurement-based method for improving I/Q signal calibration in microwave vector modulators, reflecting his contribution to communications technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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