This inventor holds 1 USPTO granted patent. Top assignees: Kabushiki Kaisha Topcon, The University of Electro-Communications. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Eriko Watanabe: Innovator in Optical Property Measurement
Introduction
Eriko Watanabe is a prominent inventor based in Chofu, Japan. She has made significant contributions to the field of optical measurement technology. Her innovative work focuses on developing methods and apparatuses that enhance the detection of abnormalities in various samples.
Latest Patents
Watanabe holds a patent for an "Optical property measurement apparatus and optical property measurement method." This invention enables the detection of abnormalities in a sample through a sophisticated interference optical system. The apparatus utilizes first and second signal lights to scan the sample, allowing for the determination of optical path length differences and the acquisition of tomographic information. This technology is crucial for obtaining a refractive index profile of the sample, which can be applied in various scientific and industrial fields. She has 1 patent to her name.
Career Highlights
Throughout her career, Eriko Watanabe has worked with notable organizations, including Topcon Corporation and the University of Electro-Communications. Her experience in these institutions has allowed her to refine her skills and contribute to advancements in optical technology.
Collaborations
Watanabe has collaborated with various professionals in her field, including her coworker Akihiko Sekine. Their joint efforts have furthered the development of innovative optical measurement techniques.
Conclusion
Eriko Watanabe's contributions to optical property measurement technology highlight her role as a leading inventor in her field. Her patented inventions and collaborations demonstrate her commitment to advancing scientific knowledge and practical applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile