Austin, TX, United States of America

Erik Stuart Hons

This inventor holds 1 USPTO granted patent. Top assignee: National Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erik Stuart Hons. Retrieved from https://idiyas.com/inventor/erik-stuart-hons

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Erik Stuart Hons and His Patent in Test-System Data Transfer.

Introduction

Erik Stuart Hons is an inventor based in Austin, Texas. His work includes a patent for coordinating data-transfer processes between components of a test system. He is associated with National Instruments Corporation.

Latest Patents

Hons is credited with one patent: “Method and System for Establishing Data Transfer Processes Between Components of a Test System.” The invention describes a first testing device that sends a stimulus to a device under test and receives testing data from a second testing device. The devices identify compatible data-reception and data-transmission methods and formats, determine their intersection, and select a final method and format for transferring test data. Hons has 1 patent.

Career Highlights

The patent reflects work on interoperability between testing devices. By enabling devices to identify compatible transfer methods and formats, the system is designed to support communication between components with different capabilities.

Collaborations

Hons is associated with National Instruments Corporation, a company whose work includes test and measurement systems. The patent concerns coordination between testing devices, though the provided information does not specify the roles of other contributors or collaborators.

Conclusion

Erik Stuart Hons’s patent addresses a practical challenge in test systems by establishing a process for selecting compatible data-transfer methods and formats.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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