Company Filing History:
Years Active: 2001-2002
Title: The Innovative Contributions of Erik Laux
Introduction
Erik Laux is a notable inventor based in Erlensee, Germany. He has made significant contributions to the field of electron beam technology, holding 2 patents that showcase his innovative methods. His work focuses on improving the operation of high-power electron beams for material vaporization.
Latest Patents
One of Erik Laux's latest patents is a method for the operation of an electron beam. This method addresses static and dynamic deflection errors, which are crucial for the accurate vaporization of materials. The process begins with a teach-in phase, where specific spatial coordinates and frequencies of deflection currents are recorded and stored. During operation, this stored data is utilized to automatically adjust input geometric data, ensuring precise incidence points for the electron beam. Additionally, the method corrects input frequencies in terms of both frequency and amplitude to mitigate frequency-dependent attenuation effects. The innovative approach guarantees that even unconsidered spatial coordinates and frequencies are accounted for, allowing for effective control of the electron beam based on specified power distributions.
Career Highlights
Throughout his career, Erik Laux has worked with several prominent companies, including Balzers und Leybold Deutschland Holding AG and Unaxis Deutschland Holding GmbH. His experience in these organizations has contributed to his expertise in electron beam technology and innovation.
Collaborations
Erik has collaborated with various professionals in his field, including his coworker Martin Bähr. Their joint efforts have likely enhanced the development and application of their innovative methods.
Conclusion
Erik Laux's contributions to electron beam technology demonstrate his commitment to innovation and improvement in material processing techniques. His patents reflect a deep understanding of the complexities involved in high-power electron beam operation.