Company Filing History:
Years Active: 2022
Title: **Erich Otto Putnik: Innovator in Workpiece Measurement Technology**
Introduction
Erich Otto Putnik, an inventive mind hailing from Oberndorf/Neckar, Germany, is recognized for his contributions to the field of measurement technology. With a singular patent to his name, Putnik has focused his efforts on refining methods for accurately determining the dimensions of various workpieces.
Latest Patents
Putnik's notable patent is titled "Method and apparatus for determining the two-point size of a workpiece." This innovative patent describes a computer-implemented method that includes receiving a set of measuring points from the workpiece. The process involves determining a longitudinal axis of the workpiece, projecting relevant measuring points into a designated projection plane, and ultimately calculating the two-point size based on the resulting projection points. This method enhances the precision and efficiency of measurement tasks undertaken in various applications.
Career Highlights
Throughout his career, Erich Otto Putnik has made significant strides in the measurement industry. He has worked with prestigious organizations such as Mitutoyo Corporation and Mitutoyo Europe GmbH. His experiences in these companies have honed his skills in measurement technology and provided him with valuable insights into industry best practices.
Collaborations
In his professional journey, Putnik has had the opportunity to collaborate with notable individuals, including his coworker Till Martin Bruckdorfer. These collaborations have contributed to the advancement of measurement technologies and have played a crucial role in the development of new methodologies.
Conclusion
Erich Otto Putnik's work exemplifies the spirit of innovation in measurement technology. His dedication to improving accuracy in workpiece sizing reflects the ongoing pursuit of excellence in engineering and technology. As his contributions continue to influence the field, Putnik stands out as an inventor committed to advancing how we understand and measure precision in various applications.