Company Filing History:
Years Active: 2005-2010
Title: Innovations by Eric T Fought
Introduction
Eric T Fought is an accomplished inventor based in Chandler, AZ (US). He has made significant contributions to the field of structural testing and I/O buffer technology. With a total of 2 patents, his work has had a notable impact on the industry.
Latest Patents
One of Eric's latest patents is focused on structural testing using boundary scan techniques. This patent discloses a boundary scan technique that generates toggling waveforms, such as square wave signals, to perform structural testing. The invention includes an instr_extesttoggle command that enables IEEE 1149.1 boundary scan cells to selectively generate toggling signals on specified output pads of integrated circuits. The frequency of the toggling signal can be controlled by the JTAG clock signal, allowing it to be independent of the length of the boundary scan chain. This innovative approach circumvents the need for provisioning test points on the interconnects of printed circuit boards.
Another significant patent by Eric is a method and apparatus for testing an I/O buffer. This invention features a buffer circuit that includes a driver device and an input device. The input device receives a first set of signals and produces a second set of signals. The driver device then receives the second set of signals and outputs a third set based on the input. A comparing device receives the third set of signals and produces a fourth set, which is then compared with the first set of signals.
Career Highlights
Eric T Fought is currently employed at Intel Corporation, where he continues to innovate and develop new technologies. His work at Intel has allowed him to explore various aspects of integrated circuit design and testing.
Collaborations
Throughout his career, Eric has collaborated with notable colleagues, including Cass A Blodgett and Akira Kakizawa. These collaborations have contributed to the advancement of technology in their respective fields.
Conclusion
Eric T Fought is a prominent inventor whose work in structural testing and I/O buffer technology has led to significant advancements in the industry. His contributions at Intel Corporation and his innovative patents reflect his dedication to improving technology.