Denton, TX, United States of America

Eric Pruett

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Pruett. Retrieved from https://idiyas.com/inventor/eric-pruett

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eric Pruett and 3D Point-Cloud Innovation

Introduction

Eric Pruett is an inventor based in Denton, Texas, and is associated with Texas Instruments Corporation. His disclosed work focuses on generating three-dimensional point clouds using spatiotemporal light patterns.

Latest Patents

The provided information identifies one patent for Pruett: “Methods and Apparatus to Generate Three Dimensional (3D) Point Clouds Based on Spatiotemporal Light Patterns.” The invention describes a controller that creates a series of light patterns from tiles, each defined by a different arrangement of illuminated pixels. A projector displays the patterns, and an image sensor captures images of their reflections. The system then uses those images to generate a three-dimensional point cloud. Pruett is credited with 1 patent in the information provided.

Career Highlights

Pruett’s listed patent connects his inventive work with Texas Instruments Corporation. The disclosed method combines projected light patterns and captured reflections to support the creation of 3D point-cloud data.

Collaborations

The available information associates Pruett with Texas Instruments Corporation and does not identify additional collaborators.

Conclusion

Eric Pruett’s listed patent describes a technique for generating 3D point clouds from projected spatiotemporal light patterns, highlighting his contribution to imaging and depth-sensing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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