Raleigh, NC, United States of America

Eric Paris

This inventor holds 1 USPTO granted patent. Top assignee: Red Hat, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Paris. Retrieved from https://idiyas.com/inventor/eric-paris-wbffvwq9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eric Paris - Innovator in Computing Diagnostics

Introduction

Eric Paris is a notable inventor based in Raleigh, NC (US). He has made significant contributions to the field of computing, particularly in diagnosing errors within Linux environments. His innovative approach has led to the development of a unique patent that addresses common issues faced by users and developers alike.

Latest Patents

Eric Paris holds a patent for a "Subsystem permission error diagnostic aid." This invention encompasses systems, methods, and apparatuses designed to determine the cause of errors in computing environments, specifically focusing on permission denied errors in Linux systems. The patented method involves executing an application in a Linux environment, monitoring various Linux subsystems and functions through instrumentation inserted in the kernel, and providing a summary of the failure's cause based on the monitoring results.

Career Highlights

Eric is currently employed at Red Hat, Inc., a leading company in open-source software solutions. His work at Red Hat allows him to apply his innovative ideas in a collaborative environment, contributing to advancements in Linux technology and error diagnostics.

Collaborations

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Conclusion

Eric Paris is a distinguished inventor whose work in error diagnostics for Linux environments showcases his expertise and innovative spirit. His contributions continue to impact the computing industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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