Raleigh, NC, United States of America

Eric M Vaughn

This inventor holds 1 USPTO granted patent. Top assignee: Emc Corporation. Active years: 2014.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Eric M Vaughn: Innovator in Data Integrity Verification

Introduction

Eric M Vaughn is a notable inventor based in Raleigh, NC (US). He has made significant contributions to the field of data integrity verification, particularly through his innovative patent. His work is essential in ensuring the reliability of data written by mainframes to virtual tapes.

Latest Patents

Eric M Vaughn holds a patent for a "Method of verifying integrity of data written by a mainframe to a virtual tape and providing feedback of errors." This invention involves a virtual tape emulator (VTE) that performs data integrity read back verification at host sync points. The VTE first flushes any buffered data to a backend storage subsystem, such as a disk array. It then reads all data written to the backend storage array between prior and current sync points. During this verification process, integrity checks are performed, and any errors detected during read back verification are returned to the host operation that triggered the sync operation. He has 1 patent to his name.

Career Highlights

Eric M Vaughn is currently employed at EMC Corporation, where he continues to develop innovative solutions in data management and integrity. His expertise in this area has made him a valuable asset to his team and the company.

Collaborations

Eric has worked alongside notable colleagues, including Larry W McCloskey and Bruce Offhaus, contributing to various projects that enhance data integrity and reliability.

Conclusion

Eric M Vaughn's contributions to data integrity verification through his innovative patent highlight his role as a significant inventor in the technology sector. His work continues to impact the reliability of data management systems.

Profile summary based on public USPTO records.
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