Company Filing History:
Years Active: 2016
Title: Innovations by Eric Liu: A Pioneer in Surface Measurement Technology.
Introduction
Eric Liu is an accomplished inventor based in Leon Valley, Texas. He has made significant contributions to the field of surface measurement technology. His innovative approach has led to the development of a unique method for measuring surface changes on non-concave surfaces.
Latest Patents
Eric Liu holds a patent for a "System and method for using laser scan micrometer to measure surface changes on non-concave surfaces." This patent describes a method of comparing surface profiles of an object that is rotatable on an axis. The process involves incrementally scanning the object with a laser scan micrometer, first in a pre-test scan procedure and then in a post-test scan procedure. The two scan procedures are performed in the same manner, allowing for accurate measurement and comparison of surface profiles.
Career Highlights
Eric Liu is currently employed at the Southwest Research Institute, where he continues to innovate and develop new technologies. His work focuses on enhancing measurement techniques that can be applied in various industries. With a patent portfolio that includes 1 patent, Liu's contributions are recognized within the scientific community.
Collaborations
Eric has collaborated with notable colleagues such as Sean Mitchem and Kerry J McCubbin. Their combined expertise has further advanced the research and development efforts at the Southwest Research Institute.
Conclusion
Eric Liu's innovative work in surface measurement technology exemplifies the spirit of invention and progress. His contributions are paving the way for advancements in measurement techniques that can benefit various fields.