The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Feb. 11, 2015
System and method for using laser scan micrometer to measure surface changes on non-concave surfaces
Southwest Research Institute, San Antonio, TX (US);
Eric Liu, Leon Valley, TX (US);
Sean C. Mitchem, Helotes, TX (US);
Kerry J. McCubbin, Helotes, TX (US);
SOUTHWEST RESEARCH INSTITUTE, San Antonio, TX (US);
Abstract
A method of comparing surface profiles of an object, the object being rotatable on an axis, such that the object has a longitudinal dimension and an axial dimension. The object is incrementally scanned with a laser scan micrometer, first in a pre-test scan procedure and then in a post-test scan procedure. The two scan procedures are performed in the same manner, by using the laser scan micrometer to scan the object in a longitudinal direction, rotating the object, re-scanning the object, measuring the scan length thereby obtaining a longitudinal height value, and repeating the preceding steps for a number of incremental rotations thereby obtaining one longitudinal height profile. This process is repeated by incrementally moving the object in an axial direction and acquiring additional longitudinal height profiles, thereby acquiring a set of longitudinal height profiles. The pre-test and post-test sets of profiles are then aligned and compared.