This inventor holds 1 USPTO granted patent. Top assignee: Tdk Corporation. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Eric Leung - Innovator in Temperature Measurement Technology
Introduction
Eric Leung is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of temperature measurement, particularly in relation to tunnel magnetoresistive (TMR) effect elements. His innovative approach has led to the development of a unique method that enhances the accuracy of temperature measurements in TMR elements.
Latest Patents
Eric Leung holds a patent for a method of measuring the temperature of a tunnel magnetoresistive effect element. This method involves several steps, including obtaining a temperature coefficient of element resistance from a discrete TMR element, applying a breakdown voltage to bring the tunnel barrier layer into a stable conductive state, and measuring the element resistance value of the mounted TMR element. The process ultimately allows for the determination of temperature based on the measured resistance value.
Career Highlights
Eric is currently employed at TDK Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in advancing the understanding and application of TMR elements in various devices. With a focus on precision and reliability, Eric has established himself as a key figure in his field.
Collaborations
Eric collaborates with talented individuals such as Yosuke Antoku and Luke Chung. Their combined expertise fosters an environment of innovation and creativity, leading to groundbreaking advancements in technology.
Conclusion
Eric Leung's contributions to the field of temperature measurement technology exemplify the impact of innovative thinking in engineering. His patent and ongoing work at TDK Corporation highlight the importance of precision in modern technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
