Pittsford, NY, United States of America

Eric John Cincotta

This inventor holds 1 USPTO granted patent. Top assignee: Itt Manufacturing Enterprises, Inc.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric John Cincotta. Retrieved from https://idiyas.com/inventor/eric-john-cincotta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Eric John Cincotta: Imaging System Analysis Inventor.

Introduction

Eric John Cincotta is an inventor associated with Pittsford, New York, and Itt Manufacturing Enterprises, Inc. His patent work addresses methods for evaluating imaging systems and the images they produce.

Latest Patents

Cincotta is credited with 1 patent, titled “Imaging System Analysis Methods and Apparatus.” The invention describes methods, systems, and computer program products for analyzing an imaging system or an image produced by it. The system senses a target against a background, with the target, background, and imaging system associated with spatial and spectral information. The method determines two of three confidence levels—spatial, spectral, and total—and calculates the remaining level in response to those determined values. This approach supports analysis of the imaging system or its image.

Career Highlights

Cincotta’s documented patent contribution focuses on combining spatial and spectral information to assess confidence in detecting a target against a background. The patent describes a framework for calculating confidence measures that can be used to analyze imaging performance.

Collaborations

Cincotta’s listed coworkers include Richard Craig Van Nostrand and Rulon Eugene Simmons. His company affiliation is Itt Manufacturing Enterprises, Inc.

Conclusion

Eric John Cincotta’s patent highlights a structured approach to imaging-system analysis, using spatial and spectral confidence measures to evaluate target detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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