Webster, NY, United States of America

Eric J Knappenberger


Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2002-2009

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2 patents (USPTO):Explore Patents

Title: The Innovations of Eric J Knappenberger

Introduction

Eric J Knappenberger is an accomplished inventor based in Webster, NY (US). He has made significant contributions to the field of image detection and analysis, holding a total of 2 patents. His work focuses on advanced methods and apparatuses that enhance the capabilities of imaging technologies.

Latest Patents

One of his latest patents is titled "Spectral polarimetric image detection and analysis methods and apparatus." This invention discloses methods for detecting and analyzing spectral polarimetric images by selecting specific spectral bands of light from a light source and capturing polarimetric images of those bands. The analysis involves converting these images into Stokes images and selecting multiple Stokes images for further examination. Another notable patent is the "Method for manufacturing charge-coupled image sensors." This method outlines a detailed process for creating image sensors, including steps such as providing a substrate, depositing a silicon layer, and growing an oxide on etched surfaces.

Career Highlights

Throughout his career, Eric has worked with notable companies, including Itt Manufacturing Enterprises, Inc. and Eastman Kodak Company. His experience in these organizations has contributed to his expertise in imaging technologies and sensor manufacturing.

Collaborations

Eric has collaborated with several professionals in his field, including J Daniel Newman and Paul P Lee. These collaborations have likely enriched his work and led to innovative advancements in his projects.

Conclusion

Eric J Knappenberger's contributions to the field of imaging technology through his patents and career experiences highlight his role as a significant inventor. His work continues to influence advancements in image detection and analysis methods.

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