Danville, VT, United States of America

Eric J Hewitt

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Understory, LLC. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric J Hewitt. Retrieved from https://idiyas.com/inventor/eric-j-hewitt-qyo9srvw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Eric J Hewitt

Introduction

Eric J Hewitt is an accomplished inventor based in Danville, Vermont. He has made significant contributions to the field of weather measurement technology. His innovative work focuses on sensing hydrometeors, particularly rain, and measuring their characteristics.

Latest Patents

Eric holds a patent for a rain sensor technology. This invention relates to measuring weather data and includes apparatuses, methods, and systems for sensing hydrometeors. The technology is designed to measure various hydrometeor characteristics, such as volume, rate, and size distribution.

Career Highlights

Eric is currently employed at Understory, LLC, where he continues to develop and refine his innovative technologies. His work has garnered attention for its potential applications in weather monitoring and environmental research.

Collaborations

Eric collaborates with talented individuals such as John P Leonard and Kyle Z Jero. Their combined expertise contributes to the advancement of weather measurement technologies.

Conclusion

Eric J Hewitt's contributions to the field of weather measurement through his innovative rain sensor technology highlight his role as a significant inventor. His work continues to impact the way we understand and measure weather phenomena.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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