Woodinville, WA, United States of America

Eric Helzer

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Honeywell International Inc., Ossia Inc.. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Helzer. Retrieved from https://idiyas.com/inventor/eric-helzer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 3

Forward Citations = 120(Granted Patents)


Company Filing History:


Years Active: 2015-2026

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4 patents (USPTO):Explore Patents

Title: Eric Helzer: Innovator in Building Control Technology

Introduction

Eric Helzer is a notable inventor based in Woodinville, WA (US). He has made significant contributions to the field of building control technology. With a total of 4 patents to his name, Helzer has established himself as a key player in innovation.

Latest Patents

Among his latest inventions is a building control device that enhances the efficiency and functionality of building management systems. This device reflects his commitment to improving technology in the construction and management sectors.

Career Highlights

Eric Helzer is currently employed at Honeywell International Inc., a leading company in technology and manufacturing. His work at Honeywell has allowed him to develop and refine his innovative ideas, contributing to the company's reputation for excellence.

Collaborations

Throughout his career, Helzer has collaborated with talented individuals such as Shanna Lorraine Leeland and Philip Shen. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Eric Helzer's contributions to building control technology exemplify his dedication to innovation and excellence. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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