San Jose, CA, United States of America

Eric F Chun

This inventor holds 1 USPTO granted patent. Top assignee: Altera Corporation. Active years: 1997.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Eric F Chun

Introduction

Eric F Chun is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor manufacturing. His work focuses on enhancing the integrity of device testers used in the production of semiconductor devices.

Latest Patents

Eric F Chun holds a patent for a "Method and apparatus for checking the integrity of a device." This invention provides a method and apparatus for verifying the integrity of a device tester utilized in the manufacturing process of semiconductor devices. The device tester is designed to exercise various aspects of a semiconductor device. It is programmed with control software that thoroughly tests the electrical and functional characteristics of the semiconductor device. He has 1 patent to his name.

Career Highlights

Eric is currently employed at Altera Corporation, a company known for its innovative solutions in the semiconductor industry. His role involves working on advanced technologies that improve the efficiency and reliability of semiconductor devices.

Collaborations

Throughout his career, Eric has collaborated with several professionals, including Alan Achor and Ernest Allen, III. These collaborations have contributed to the development of cutting-edge technologies in the semiconductor field.

Conclusion

Eric F Chun is a distinguished inventor whose work has significantly impacted the semiconductor manufacturing industry. His innovative patent and contributions to Altera Corporation highlight his commitment to advancing technology.

Profile summary based on public USPTO records.
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