Montigny Le Bretonneux, France

Eric Compain

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Office National D'etudes Et De Recherches Aerospatiales. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Compain. Retrieved from https://idiyas.com/inventor/eric-compain-g5l6uajf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eric Compain and His Optical Imaging Invention.

Introduction

Eric Compain is an inventor based in Montigny-le-Bretonneux, France. His patent work includes an optical imaging system designed to manage multiple parallel optical paths while maintaining image quality.

Latest Patents

Compain is associated with 1 patent: “Optical Imaging System with Multiple Paths Arranged in Parallel and a Common Entrance Aperture.” The invention describes an athermalized optical imaging system with multiple parallel paths and a shared entrance aperture. It is designed to prevent images from overlapping within the useful areas of a matrix image sensor shared by those paths. A thermal compensation device helps maintain athermalization and also supports a baffle that removes image overlap from the sensor’s useful areas.

Career Highlights

Compain is associated with the Office National d’Études et de Recherches Aérospatiales, a French aerospace research organization. His patent reflects work on optical imaging, thermal compensation, and image separation.

Collaborations

The provided information identifies Guillaume Druart and Sylvain Favier as Compain’s coworkers.

Conclusion

Eric Compain’s patent addresses the challenges of thermal stability and image overlap in multi-path optical systems, highlighting his contribution to aerospace-related imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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