This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Eric Bernillon and His Integrated-Circuit Testing Patent.
Introduction
Eric Bernillon is an inventor associated with Antibes, France. His patent work addresses a method for testing integrated circuits with a Direct Memory Load Execute Dump (DMLED) test module.
Latest Patents
Bernillon is associated with 1 patent, titled “Testing of Integrated Circuits Using Test Module.” The invention describes loading a test case and fixed-pattern initialization signatures into memory with a DMLED test module, then executing the test case at the processor’s operating clock rate. Result signatures are written to memory and subsequently transferred to a tester using the module.
Career Highlights
The available information associates Bernillon with Texas Instruments Corporation. His patent focuses on a testing approach that uses memory to manage test cases and signatures during integrated-circuit evaluation.
Collaborations
Pascal Cussonneau is identified as Bernillon’s coworker. The available details do not specify their particular projects or working relationship.
Conclusion
Eric Bernillon’s documented invention concerns a DMLED-based method for testing integrated circuits, and his listed professional association is Texas Instruments Corporation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile