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For the Inventor, By the Inventor

Vence, France

Eric Balard

This inventor holds 3 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 2002-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Balard. Retrieved from https://idiyas.com/inventor/eric-balard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3

% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 56(Granted Patents)


Company Filing History:

goldMedal3 out of 29,888 
 
Texas Instruments Corporation
 patents

Years Active: 2002-2012

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3 patents (USPTO):Explore Patents
1. 8122244 - Secure management of configuration parameters in a computing platform (2012-02-21),
2. 7539868 - Run-time firmware authentication (2009-05-26),
3. 6396426 - Embedded mechanism offering real-time self failure detection for an analog to digital converter (2002-05-28),

Title: Inventor Eric Balard: Pioneering Innovations in Vence, FR

Introduction: Eric Balard is a distinguished inventor based in Vence, France, known for his groundbreaking contributions to various technological fields.

Latest Patents: Eric Balard holds several patents in the areas of renewable energy, sustainable materials, and smart devices, showcasing his commitment to creating a more environmentally friendly future.

Career Highlights: With a career spanning over two decades, Eric Balard has worked with leading research institutions and universities to develop cutting-edge solutions that have revolutionized industries worldwide.

Collaborations: Throughout his career, Eric Balard has collaborated with top companies and innovative minds to bring his ideas to life, resulting in successful products that have had a significant impact on society.

Conclusion: Eric Balard's passion for innovation and dedication to creating sustainable technologies make him a visionary inventor whose work continues to inspire future generations in Vence, France, and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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