Princeton, NJ, United States of America

Eric A Shaner

This inventor holds 1 USPTO granted patent. Top assignee: Princeton University. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric A Shaner. Retrieved from https://idiyas.com/inventor/eric-a-shaner-7zknnzlx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2003

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Eric A Shaner: Innovator in Non-Contact Measurement Technologies

Introduction

Eric A Shaner is a notable inventor based in Princeton, NJ (US). He has made significant contributions to the field of material measurement through his innovative patent. His work focuses on non-contact methods for assessing the electrical properties of various materials, which is crucial in today's high-frequency technology landscape.

Latest Patents

Eric A Shaner holds a patent titled "Method and apparatus for non-contact measurement of electrical properties of materials." This invention relates to a method and apparatus for measuring material properties using guided-wave THz spectroscopy. The technology allows for the measurement of complex dielectric functions of materials. A high-frequency wave is created and launched along a waveguide positioned in close proximity to the material under test. The wave is sampled initially, allowed to propagate, and sampled again. The samples are processed to derive information, such as resistivity, of the wafer. This method not only provides information about the DC conductivity of metals but also offers insights into the high-frequency behavior of materials, which is increasingly important as processor clocks approach GHz levels. The invention enables non-contact, non-destructive, and non-contaminating testing.

Career Highlights

Eric A Shaner is affiliated with Princeton University, where he continues to advance research in material properties and measurement techniques. His innovative approach has positioned him as a key figure in the development of non-contact measurement technologies.

Collaborations

Throughout his career, Eric has collaborated with esteemed colleagues, including Stephen A Lyon and Igor E Trofimov. These collaborations have further enriched his research and contributed to the advancement of technology in his field.

Conclusion

Eric A Shaner exemplifies the spirit of innovation in the realm of material measurement. His contributions through his patent have paved the way for advancements in non-contact testing methods, which are essential in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…