Ueda, Japan

Eri Iiyama

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Epson Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eri Iiyama. Retrieved from https://idiyas.com/inventor/eri-iiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Eri Iiyama and Printer Data Verification

Introduction

Eri Iiyama is an inventor associated with Ueda, Japan, and Seiko Epson Corporation. Her patent work addresses reliable transfer and processing of print data.

Latest Patents

The provided information lists one patent for Iiyama: “Printer and Control Method of a Printer.” The invention describes a printer with a printhead and a processor that receives transaction data from an external device. The processor extracts the print data and its error detection code, calculates a second code, and compares the two. If the codes match, the printer prints using the received data; if they do not, it discards the data. The processor also sends the external device information about the evaluation result. Iiyama is credited with 1 patent.

Career Highlights

Iiyama’s listed invention focuses on checking print data before printing, helping a printer respond to data that fails verification. She is associated with Seiko Epson Corporation, a company known for its printing technologies.

Collaborations

The provided information names Kei Watanabe and Yuki Yajima as Iiyama’s coworkers. It does not specify their roles in the patent or describe particular collaborations.

Conclusion

Eri Iiyama’s listed patent presents a printer control method that verifies transaction print data before allowing it to be printed, reflecting a focus on dependable printer operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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