This inventor holds 1 USPTO granted patent. Top assignee: Kitov Systems Ltd. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Eran Vered: Innovator in Automated Inspection Technologies
Introduction
Eran Vered is a notable inventor based in Ramat Gan, Israel. He has made significant contributions to the field of automated inspection technologies. His innovative approach has led to the development of systems and methods that enhance the efficiency of part enrollment and inspection processes.
Latest Patents
Eran Vered holds a patent for "Automated inspection and part enrollment." This patent describes systems and methods for automated inspection and part enrollment. In one implementation, a selection of an area of a part is received within a graphical user interface depicting a representation of the part. Based on the selection of the area of the part, a location of the selected area is determined. Image capture parameters are determined based on the determined location. Based on the determined image capture parameters and the location of the selected area, an inspection path is computed with respect to the part. The computed inspection path is executed with respect to the part via an inspection system. He has 1 patent to his name.
Career Highlights
Eran Vered is currently associated with Kitov Systems Ltd., where he continues to innovate in the field of automated inspection. His work has been instrumental in advancing the capabilities of inspection systems, making them more efficient and reliable.
Collaborations
Eran has collaborated with notable colleagues such as Nir Avrahami and Joseph Rubner. Their combined expertise has contributed to the success of various projects within Kitov Systems Ltd.
Conclusion
Eran Vered is a pioneering inventor whose work in automated inspection technologies has made a significant impact in the industry. His contributions continue to shape the future of inspection systems, enhancing their functionality and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile