Jerusalem, Israel

Ephraim Schwartz

This inventor holds 1 USPTO granted patent. Top assignee: Idea Machine Development Design and Production Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ephraim Schwartz. Retrieved from https://idiyas.com/inventor/ephraim-schwartz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ephraim Schwartz: Advancing Automated Microscopy

Introduction

Ephraim Schwartz is an inventor based in Jerusalem, Israel. His work includes a microscopy system designed to automate the application of immersion liquid and support efficient sample imaging.

Latest Patents

Schwartz is associated with 1 patent, titled “Microscopy System and Method Using an Immersion Liquid.” The invention describes a microscopy device that moves a liquid-immersion objective lens to a location where oil, water, or another immersion liquid can be applied, then positions the lens over a sample holder for image acquisition. The liquid application can be automated and replenished as needed. The device can also automatically focus the lens, support scanning, and change objective lenses. The patent describes applications that include high-content and high-throughput scanning.

Career Highlights

Schwartz is associated with Idea Machine Development Design and Production Ltd. His patented work focuses on automating microscopy processes, including immersion-liquid application, focusing, and scanning.

Collaborations

Schwartz’s listed coworkers include Alon Atzei-pri and Eitan Sheffer. Their names are provided as professional associations, though specific joint projects are not detailed in the supplied information.

Conclusion

Ephraim Schwartz’s microscopy invention brings together automated liquid application, lens focusing, and scanning to support more efficient sample imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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