Chengdu, China

Enlai Liu

This inventor holds 1 USPTO granted patent. Top assignee: Chengdu University of Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Enlai Liu. Retrieved from https://idiyas.com/inventor/enlai-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Enlai Liu: Innovator in Tunnel Monitoring Technology

Introduction

Enlai Liu is a prominent inventor based in Chengdu, China. He has made significant contributions to the field of tunnel monitoring technology. His innovative approach addresses critical challenges in measuring large deformations in tunnel surrounding rocks.

Latest Patents

Enlai Liu holds a patent titled "Method for monitoring large deformation of tunnel surrounding rock based on automatic target tracking and ranging system." This method involves acquiring a target monitoring image through a camera module, identifying the center image position, and performing an automatic targeting and ranging task using a laser ranging module. The process calculates deformation offsets for various targets, significantly enhancing the reliability of monitoring results.

Career Highlights

Enlai Liu is affiliated with Chengdu University of Technology, where he continues to advance research in tunnel monitoring systems. His work has garnered attention for its practical applications in civil engineering and safety.

Collaborations

Enlai Liu collaborates with notable colleagues, including Lubo Meng and Fuli Kong. Their combined expertise contributes to the development of innovative solutions in their field.

Conclusion

Enlai Liu's contributions to tunnel monitoring technology exemplify the impact of innovative thinking in engineering. His patented method not only addresses existing challenges but also sets a foundation for future advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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