Foster City, CA, United States of America

Eng Kiat Koh

This inventor holds 1 USPTO granted patent. Top assignee: Experian Information Solutions, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eng Kiat Koh. Retrieved from https://idiyas.com/inventor/eng-kiat-koh-wlv4ob9l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eng Kiat Koh and Fraud-Detection Workflow Orchestration

Introduction

Eng Kiat Koh is an inventor based in Foster City, California, and is associated with Experian Information Solutions, Inc. His patent work concerns the use of machine learning and workflow orchestration to support fraud detection.

Latest Patents

Koh is named on 1 patent: “System and Method for a Workflow Orchestration Platform for Fraud Detection.” The invention describes a decision analytics system that uses historical transaction data to train a machine-learning algorithm. Based on attributes in the data, the algorithm can form clusters and identify suitable backing applications, such as identity or fraud-risk services, to help detect fraudulent or potentially fraudulent transactions.

Career Highlights

Koh’s listed patent reflects work at the intersection of transaction analytics, machine learning, and fraud-risk workflows. The disclosed approach organizes data-driven decisions and connects transaction clusters with relevant services.

Collaborations

Koh’s listed coworkers include Yi Chen and Ryan Wyeth Kemmer. The patent describes a system involving workflow orchestration and decision analytics, though the provided information does not specify the coworkers’ roles in the invention.

Conclusion

Eng Kiat Koh’s patent focuses on coordinating machine-learning analysis and risk services to help identify potentially fraudulent transactions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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