Bentley, Australia

En-Shan Looi

This inventor holds 2 USPTO granted patents, plus 1 CIPO patent and 2 EPO patents. Top assignees: Amlab Pty Ltd, Technological Resources Pty. Limited. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: En-Shan Looi. Retrieved from https://idiyas.com/inventor/en-shan-looi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: En-Shan Looi: Innovator in Vessel Draft Measurement Technology

Introduction

En-Shan Looi is a notable inventor based in Bentley, Australia. She has made significant contributions to the field of vessel draft measurement technology. Her innovative approach combines optical imaging and GNSS technology to enhance the accuracy of draft surveys.

Latest Patents

En-Shan Looi holds a patent for an "Automated draft survey." This method involves measuring the draft of a vessel using at least one optical imaging device to provide optical draft measurement data. Additionally, it incorporates elevation data from GNSS or GPS devices to offer elevation draft measurement data. By integrating these two data sources, the method effectively determines the draft of the vessel.

Career Highlights

En-Shan Looi is associated with Technological Resources Pty. Limited, where she applies her expertise in developing advanced measurement technologies. Her work has been instrumental in improving the efficiency and accuracy of draft surveys in maritime operations.

Collaborations

En-Shan collaborates with talented professionals such as Troy Epskamp and Jonathon Zeelenberg. Their combined efforts contribute to the advancement of innovative solutions in their field.

Conclusion

En-Shan Looi's contributions to vessel draft measurement technology exemplify her commitment to innovation. Her patent and collaborative efforts highlight her role as a leading inventor in this specialized area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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