Taipei, Taiwan

En-Chin Liao

This inventor holds 1 USPTO granted patent. Top assignee: Taichung Veterans General Hospital. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: En-Chin Liao. Retrieved from https://idiyas.com/inventor/en-chin-liao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: En-Chin Liao: Innovator in Allergy Detection

Introduction

En-Chin Liao is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of allergy detection through his innovative work. His research focuses on developing tools that can help identify allergens in the environment, particularly those related to dust mites.

Latest Patents

En-Chin Liao holds a patent for a monoclonal antibody that specifically recognizes and binds to an epitope of group 2 allergen, commonly referred to as Der p 2. This invention also includes a hybridoma cell line that produces the antibody. Additionally, it discloses a strip, kit, and method that utilize the monoclonal antibody for detecting the presence of dust mite allergens and calculating the dust mite population in various environments. He has 1 patent to his name.

Career Highlights

En-Chin Liao is affiliated with Taichung Veterans General Hospital, where he continues to advance his research in allergy detection. His work has implications for improving the quality of life for individuals suffering from allergies.

Collaborations

En-Chin Liao collaborates with Jaw-Ji Tsai, contributing to the development of innovative solutions in the field of allergen detection.

Conclusion

En-Chin Liao's contributions to allergy detection through his patented inventions highlight the importance of innovation in addressing health-related challenges. His work continues to pave the way for advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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