Istanbul, Turkey

Emre Kaan Satiş

This inventor holds 1 USPTO granted patent. Top assignee: Ava Labs, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Emre Kaan Satiş. Retrieved from https://idiyas.com/inventor/emre-kaan-satis-k6mw9mzf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Emre Kaan Satiş and Cross-Scheme Cryptographic Verification

Introduction

Emre Kaan Satiş is an inventor based in Istanbul, Türkiye, whose patent work concerns confidential value transfers on distributed ledger systems. His listed patent is associated with Ava Labs, Inc.

Latest Patents

Satiş is credited with 1 patent: “Cross-scheme cryptographic verification in a distributed ledger.” The invention describes a method for protecting transfer values while enabling verification on a distributed ledger. It uses two different homomorphic encryption schemes to create separate ciphertexts, along with a cryptographic commitment to the transfer value. The system generates proofs that establish the validity of the encryption and the relationships among the ciphertexts and commitment. After successful verification, the ciphertexts, commitment, and proofs can be submitted to the ledger.

Career Highlights

The patent reflects work at the intersection of cryptography and distributed ledger technology. Its approach aims to support confidential transfers while allowing a ledger system to verify relevant properties without revealing the underlying value.

Collaborations

Satiş’s listed coworkers include Furkan Boyraz and Mehmet Berat Öztürk. The patent is associated with Ava Labs, Inc.

Conclusion

Emre Kaan Satiş’s patent describes a cross-scheme cryptographic approach to confidential value transfers, combining homomorphic encryption, commitments, and proofs for distributed ledger verification.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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