This inventor holds 2 USPTO granted patents. Top assignees: Compugrade, Inc, Identigrade. Active years: 1992.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1992
Title: Emmett J Lenaz, Jr: Innovator in Surface Illumination and Evaluation
Introduction
Emmett J Lenaz, Jr is a notable inventor based in New Orleans, LA (US). He has made significant contributions to the field of surface illumination and evaluation, particularly in the context of numismatic quality assessment.
Latest Patents
Lenaz holds 2 patents that focus on systems for illuminating and evaluating surfaces. His latest patent describes systems and methods for illuminating an object surface with light at varying angles of incidence. This innovation allows for the optical evaluation of the object surface for features and defects. A specific implementation of this technology targets coins, enabling accurate and objective evaluation of their numismatic quality. The techniques central to this invention involve applying a uniform confined beam of light to the surface of the target object. The angles of incidence include both perpendicular and parallel components relative to the object surface. This method ensures that the light beam illuminates the object surface from a well-defined direction, which can be adjusted by redefining the component angle of incidence ranges. Additionally, these techniques are capable of imaging the surface luster of the coin.
Career Highlights
Throughout his career, Lenaz has worked with various companies, including Identigrade and Compugrade, Inc. His work has significantly impacted the field of surface evaluation, particularly in numismatics.
Collaborations
Lenaz has collaborated with notable individuals such as Henry A Merton and James R Diefenthal, contributing to advancements in his field.
Conclusion
Emmett J Lenaz, Jr is a distinguished inventor whose work in surface illumination and evaluation has paved the way for innovative techniques in numismatic quality assessment. His contributions continue to influence the industry and enhance the understanding of surface features and defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile