Jerusalem, Israel

Emmanuel Binnun

This inventor holds 1 USPTO granted patent. Top assignee: Talia Technology Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Emmanuel Binnun. Retrieved from https://idiyas.com/inventor/emmanuel-binnun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations in Retinal Imaging by Emmanuel Binnun

Introduction

Emmanuel Binnun is a notable inventor based in Jerusalem, Israel. He has made significant contributions to the field of retinal imaging technology. His work focuses on enhancing the methods used to acquire and analyze retinal data, which is crucial for diagnosing various eye conditions.

Latest Patents

Binnun holds a patent for an innovative apparatus designed for acquiring, analyzing, and imaging three-dimensional retinal data. This apparatus combines a digital fundus camera with a Retinal Thickness Analyzer (RTA). It utilizes common optical, electrical, and mechanical components to achieve peripheral illumination and centered image acquisition of the eye fundus. The system also includes a lateral slit-illumination feature for measuring retinal thickness, providing a comprehensive view of the retina.

Career Highlights

Emmanuel Binnun is currently associated with Talia Technology Ltd., where he continues to develop advanced technologies in retinal imaging. His expertise in this area has positioned him as a key figure in the field, contributing to improved diagnostic tools for eye care professionals.

Collaborations

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Conclusion

Emmanuel Binnun's innovative work in retinal imaging technology exemplifies the impact of inventions on medical diagnostics. His contributions are paving the way for advancements in eye care and patient outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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