Company Filing History:
2 out of 7 
2 out of 5 
1 out of 89 
Years Active: 1999-2006
Title: Emeric Johnson: Innovator in Workpiece Inspection Technology
Introduction
Emeric Johnson is a notable inventor based in Salmon Arm, Canada. He has made significant contributions to the field of workpiece inspection technology, holding a total of 8 patents. His innovative approaches have led to advancements in detecting defects and improving the classification of attributes in various workpieces.
Latest Patents
Among his latest patents is a method and apparatus for improved inspection classification of attributes of a workpiece. This invention describes an apparatus designed to detect the probable existence, location, and type of defects in a workpiece. The apparatus includes a sensor subsystem that senses a section of the workpiece and produces signals corresponding to its physical characteristics. The computer system generates a workpiece model based on these signals. Additionally, a defect assembler can merge signals from multiple sensor subsystems to create a comprehensive workpiece data model. The optimizer generates segmentation recommendations based on this model. Another notable patent involves a tracking device that monitors the kinematics of a workpiece as it moves through a plant, utilizing an encoder wheel and a signal generator to ensure accurate tracking.
Career Highlights
Emeric Johnson has worked with several companies throughout his career, including Coe Newnes/McGehee and CAE Electronics Ltd. His experience in these organizations has contributed to his expertise in developing innovative inspection technologies.
Collaborations
Throughout his career, Emeric has collaborated with professionals such as Michael McGuire and Harry Ogloff. These partnerships have likely enriched his work and led to further advancements in his field.
Conclusion
Emeric Johnson's contributions to workpiece inspection technology demonstrate his innovative spirit and dedication to improving industrial processes. His patents reflect a commitment to enhancing the accuracy and efficiency of defect detection in manufacturing.