The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Jul. 05, 2001
Steve C. Woods, Salmon Arm, CA;
Michael McGuire, Salmon Arm, CA;
Harry Ogloff, Salmon Arm, CA;
Zvonimr Skocic, Salmon Arm, CA;
Emeric Johnson, Salmon Arm, CA;
Coe Newnes/McGehee ULC, Salmon Arm, CA;
Abstract
An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. The sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals front a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.