logo

For the Inventor, By the Inventor

Turin, Italy

Emanuele Ricci

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Hexagon Metrology Gmbh. Active years: 2012-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Emanuele Ricci. Retrieved from https://idiyas.com/inventor/emanuele-ricci

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:

goldMedal2 out of 122 
 
Hexagon Metrology Gmbh
 patents

Years Active: 2012-2018

Loading Chart...
Loading Chart...
2 patents (USPTO):Explore Patents
1. 9879967 - Method for compensating measurement errors due to thermally induced structural deformations in a coordinate measurement machine (2018-01-30),
2. 8166664 - Method of aligning arm reference system of a multiple-arm measurement machine (2012-05-01),

Title: Inventor Emanuele Ricci - Pioneering Innovations in Turin

Introduction: Emanuele Ricci, a visionary inventor hailing from Turin, Italy, is renowned for her groundbreaking contributions to the field of technology and innovation.

Latest Patents: Emanuele Ricci holds several patents in the areas of renewable energy technologies, sustainable transportation solutions, and advanced materials science.

Career Highlights: With a career spanning over two decades, Emanuele Ricci has worked tirelessly to develop cutting-edge inventions that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout her career, Emanuele Ricci has collaborated with leading research institutions, universities, and companies to bring her innovative ideas to life and make a lasting impact on society.

Conclusion: Emanuele Ricci's passion for innovation and her dedication to pushing the boundaries of what is possible continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…