Tokyo, Japan

Ema Odajima

This inventor holds 1 USPTO granted patent. Top assignee: Fujifilm Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ema Odajima. Retrieved from https://idiyas.com/inventor/ema-odajima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Ema Odajima in Tokyo

Introduction: Ema Odajima, an inventive spirit based in Tokyo, Japan, has made her mark in the world of technology. With a keen focus on modernizing office equipment, she has filed a patent that showcases her creativity and technical expertise.

Latest Patents: Ema holds a significant patent for a Combination Copier, Scanner, and Printer. This innovative device aims to streamline printing and documentation processes, enhancing productivity and efficiency for users.

Career Highlights: Ema is currently employed at Fujifilm Corporation, a leading company renowned for its imaging and information technology solutions. Her role within the firm allows her to further develop her ideas and translate them into practical applications that meet the needs of contemporary users.

Collaborations: Throughout her career, Ema has collaborated with her coworker, Tsutomu Shiihara. Their partnership highlights the synergy between talented professionals, fostering an environment where innovative ideas can flourish and be transformed into successful inventions.

Conclusion: Ema Odajima's contributions to the field of technology reflect her dedication to innovation and problem-solving. With her patent and collaboration with esteemed colleagues, she continues to pave the way for future advancements in office technology. The impact of her work is sure to resonate within the industry for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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