Middleton, MA, United States of America

Elyssa F Kaplan

This inventor holds 1 USPTO granted patent. Top assignee: The Mitre Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elyssa F Kaplan. Retrieved from https://idiyas.com/inventor/elyssa-f-kaplan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Elyssa F Kaplan: Innovator in Remote Optical Screening Technology

Introduction

Elyssa F Kaplan is a notable inventor based in Middleton, MA (US). He has made significant contributions to the field of optical screening technology. His innovative work focuses on the estimation of vital signs using camera data, which has potential applications in various sectors.

Latest Patents

Elyssa F Kaplan holds 1 patent for his invention titled "Systems and methods for remote optical screening of individuals in entryways." This patent describes systems and methods that utilize RGB camera data to estimate vital signs. The technology involves analyzing video data to identify regions of interest and monitor changes in pixel color to determine heart rate and respiratory rate.

Career Highlights

Kaplan is associated with The Mitre Corporation, where he applies his expertise in developing advanced screening technologies. His work has the potential to enhance safety and health monitoring in public spaces.

Collaborations

Elyssa has collaborated with colleagues such as Daniel Sims and Kevin Thomas Dickey, contributing to the advancement of innovative technologies in his field.

Conclusion

Elyssa F Kaplan's contributions to remote optical screening technology exemplify the impact of innovation in health monitoring. His work continues to pave the way for advancements in vital sign estimation using camera data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…