This inventor holds 2 USPTO granted patents. Top assignee: Georgia Tech Research Corporation. Active years: 1999-2007.
Location History:
- Oak Ridge, TN (US) (1999)
- Peoria, IL (US) (2007)
Company Filing History:
Years Active: 1999-2007
Title: Elmer Zanoria: Innovator in Wear Monitoring Technology
Introduction
Elmer Zanoria is a notable inventor based in Oak Ridge, TN (US). He has made significant contributions to the field of wear monitoring technology, holding 2 patents that showcase his innovative approach to non-contact sensing methods.
Latest Patents
Zanoria's latest invention is a non-vibrating capacitance probe designed for wear monitoring. This device functions as a non-contact sensor for tribological wear on components. It detects surface charge through temporal variation in the work function of a material. A reference electrode senses the changing contact potential difference over the component surface, which is influenced by compositional variations. The temporal variation in the contact potential difference induces a current through an electrical connection. This current is then amplified and converted to a voltage signal by an electronic circuit utilizing an operational amplifier.
Career Highlights
Elmer Zanoria is currently associated with the Georgia Tech Research Corporation, where he continues to develop and refine his innovative technologies. His work has positioned him as a key figure in the advancement of wear monitoring systems.
Collaborations
Zanoria collaborates with esteemed colleagues such as Steven Danyluk and Anatoly Zharin, contributing to a dynamic research environment that fosters innovation and technological advancement.
Conclusion
Elmer Zanoria's contributions to wear monitoring technology through his patents reflect his dedication to innovation in engineering. His work continues to influence the field and inspire future advancements.