North Reading, MA, United States of America

Elmer R Jones

This inventor holds 8 USPTO granted patents. Top assignees: Ej Systems, Inc., Aetrium, Inc., Other. Active years: 1980-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elmer R Jones. Retrieved from https://idiyas.com/inventor/elmer-r-jones

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 7

Forward Citations = 323(Granted Patents)


Company Filing History:


Years Active: 1980-2002

Loading Chart...
8 patents (USPTO):Explore Patents

Title: Elmer R. Jones: Innovator in Semiconductor Testing Technology

Introduction

Elmer R. Jones is a notable inventor based in North Reading, MA (US). He has made significant contributions to the field of semiconductor testing technology, holding a total of 8 patents. His innovative designs have advanced the efficiency and effectiveness of testing devices under test (DUTs).

Latest Patents

Among his latest patents is the "Flexibly Suspended Heat Exchange Head for a DUT." This thermoconductive module is designed to control the temperature of a DUT. It features a top surface with a heat exchange surface that interfaces with the DUT, along with a plurality of individually moveable elements that contour the heat exchange surface to match the DUT's topography. Another significant patent is the "Test Handler for DUTs," which describes a handling system for semiconductor chips. This system includes a rotatable platform with multiple boats for DUTs, allowing for efficient preconditioning and testing of chips.

Career Highlights

Elmer R. Jones has worked with several companies throughout his career, including Ej Systems, Inc. and Aetrium, Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and testing systems.

Collaborations

(Section skipped due to space constraints)

Conclusion

Elmer R. Jones is a distinguished inventor whose work has significantly impacted the semiconductor testing industry. His innovative patents and career achievements reflect his dedication to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…